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SANTA CLARA, Calif., May 29 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE:6857TSE:NYSE:TSE:ATE), a leading supplier of automatic test...
Annual VLSI Research Customer Satisfaction Survey Highlights Advantest's Industry-Leading SoC ATE Cost-of-Ownership as Key to Chip Makers' Success...
SANTA CLARA, Calif., Feb. 26 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE:6857TSE:NYSE:TSE:ATE), the world's leading supplier of...
. . . The only ATE supplier to sustain a five-star rating throughout the 4 year program SANTA CLARA, Calif., Dec. 18 /PRNewswire-FirstCall/...
System offers low-cost test for analog devices TOKYO, Dec. 1 /PRNewswire-FirstCall/ -- Advantest Kyushu Systems Co., Ltd., a wholly-owned...
Best-in-class test speeds and enhanced functionality offer low-cost production solution TOKYO, Nov. 14 /PRNewswire-FirstCall/ -- Advantest...
Annual Event Recognizes Excellence in Semiconductor Industry SANTA CLARA, Calif., Nov. 12 /PRNewswire-FirstCall/ -- Advantest Corporation...
Joint training and research projects to foster development of new test methodologies SANTA CLARA, Calif., Oct. 27 /PRNewswire/ -- Advantest...
TOKYO, Aug. 27 /PRNewswire-FirstCall/ -- Advantest Corporation, the world's leading semiconductor test equipment manufacturer, has completed its...
TOKYO, July 15 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE:6857TSE: NYSE:TSE:ATE), the world's leading supplier of semiconductor test...
Introduces Fully Integrated RF Test Cell Solution and demonstrates new, compact, cost effective, SoC Test Solution for Digital Consumer and...
Unparalleled flexibility provides lowest cost of ownership for multi-site production testing SAN FRANCISCO, July 14 /PRNewswire-FirstCall/...
TOKYO, July 10 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE:6857TSE:NYSE:TSE:ATE), the world's leading supplier of semiconductor test...
Annual customer satisfaction survey highlights strength of Advantest's test solutions and gives company its 20th consecutive-year listing SANTA...
Cost-effective, IC test system offers parallel test capabilities for high-pincount graphic and chipset technologies SANTA CLARA, Calif., June 18...
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