Mentor Graphics Expands DFM Strategy with YieldAssist Diagnostics Tool for Yield Improvement
31 10월 2005 - 11:00PM
Business Wire
Mentor Graphics Corporation (Nasdaq:MENT) today announced the
immediate availability of the YieldAssist(TM) diagnostic tool. With
the ability to quickly and accurately identify and isolate
yield-limiting defects, YieldAssist enhances semiconductor yield
and expands Mentor's Design-for-Test (DFT) product portfolio and
platform beyond classical test generation and defect detection. The
product takes failure information directly from manufacturing test,
and through advanced diagnostics, identifies failure causes to
facilitate yield learning and eliminate weeks of manual analysis
effort. Accurate diagnosis of scan test failures is a critical
element of failure analysis, and is becoming vital for yield
learning and yield improvement purposes as nanometer technologies
continue to shrink. Improving yield in the nanometer era requires
solutions that span all aspects of the design to manufacturing
flow. Failing devices from the wafer sort phase of manufacturing
test can provide a goldmine of information for yield and failure
analysis engineers. YieldAssist allows semiconductor manufacturers
to harvest this information and identify both systematic and random
defects to drive failure analysis and yield improvement. It also
provides a critical link back into the design process for improving
design for manufacturability (DFM) as well as for adaptively
improving the quality of the manufacturing test itself and reducing
defect per million (DPM) rates. The overall yield
learning/monitoring strategy that YieldAssist facilitates addresses
the three key areas needed for a complete solution; high quality
test, effective defect isolation and rapid high-volume diagnosis.
Effective detection of all the subtle defects that occur in
nanometer designs is the first step in yield improvement. The high
quality manufacturing tests created with the TestKompress(R) or
FastScan(TM) automatic test program generation (ATPG) tools provide
the foundation for improving defect detection and diagnosis. Using
the failure data from manufacturing test, YieldAssist is able to
isolate the cause of the failure and map it to defect suspects. A
link to Mentor's Calibre(R) results viewing environment (RVE)
allows users to view suspected defects in the physical design
layout view to further isolate problems down to a physical feature.
Rapid high-volume diagnosis can be achieved in a production
environment by directly reading failure logs from compressed test
patterns. This enables effective failure diagnosis directly from
production test data, avoiding the additional cost of rerunning
special tests for diagnosis purposes only. "Failure analysis is a
growing field where better tools can pay big dividends," said
Robert Hum, vice president and general manager for the Design
Verification and Test division at Mentor Graphics. "There continues
to be a need for diagnostic tools that can more finely classify
suspect defects and rapidly link those suspected defects to the
physical design for analysis. This groundbreaking advance in DFT
technology will dramatically hasten silicon failure analysis and
ultimately play a critical part in yield learning and yield
monitoring." Pricing and Availability: YieldAssist is available
immediately. Pricing starts at $126K per year for a term based
license. More information is available at www.mentor.com or by
calling 800-547-3000. About Mentor Graphics Mentor Graphics
Corporation (Nasdaq:MENT) is a world leader in electronic hardware
and software design solutions, providing products, consulting
services and award-winning support for the world's most successful
electronics and semiconductor companies. Established in 1981, the
company reported revenues over the last 12 months of about $700
million and employs approximately 3,950 people worldwide. Corporate
headquarters are located at 8005 S.W. Boeckman Road, Wilsonville,
Oregon 97070-7777; Silicon Valley headquarters are located at 1001
Ridder Park Drive, San Jose, California 95131-2314. World Wide Web
site: http://www.mentor.com/. Mentor Graphics, Calibre and
TestKompress are registered trademarks and YieldAssist and FastScan
are trademarks of Mentor Graphics Corporation. All other company or
product names are the registered trademarks or trademarks of their
respective owners.
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